Introducing the newest family of ZEISS Imaging Systems for Super-resolution across scales

The ZEISS Lattice SIM super-resolution technology has taken research beyond the diffraction limit of conventional microscopy, giving you gentle super-resolution imaging with incredibly high speed and the ability to image deeper into challenging samples beyond 120 nm. Lattice SIM² uses a 2D Lattice pattern that only requires translation, no rotation, for improved speed and higher contrast for deeper penetration into samples. SIM Apotome mode uses 2D striped illumination also without rotation for ultra-fast, exceptional optical sectioning. In combination with our SIM² reconstruction algorithm, both technologies keep pushing SIM to a new level. Technology that enables imaging the details of biological samples with super-resolution is great, but each application comes with specific challenges and requirements, for example: imaging speed to capture dynamics, large fields of view and excellent 3D capabilities for contextual imaging of larger samples, sensitivity to image delicate samples, or resolution at the edge of what's physically possible to reveal subcellular ultrastructure. If you wish you could meet these requirements for each of your samples in the best possible way, while remaining flexible across scales, then join us for this webinar to be introduced to a new family of ZEISS imaging systems and hear first-hand reports from peers how these technologies help advance their research.