FIB-SEM Innovations for Materials Characterization and Prototyping

Explore the forefront of electron microscopy with our four-part webinar series, hosted by TESCAN, a pioneer in electron microscopy innovation for over 30 years. This exclusive series introduces the new advanced AMBER X 2 and AMBER 2 systems, showcasing enhancements in FIB-SEM technology. Delve into topics such as improved speed, precision, utility in materials analysis, TEM sample preparation, and nanoprototyping. Each session offers valuable insights into the features, applications, and real-world benefits of these state-of-the-art systems.