A new era in 3D X-ray microscopy: pushing the limits, making it accessible
September 25, 2024
About the Event
Researchers and scientists across academia and industry are constantly striving to invent and discover new materials with remarkable properties that enable next generation applications across a wide range of fields, from materials research to life sciences, touching upon every aspect of today's societal challenges. At the core of many of these discoveries lies linking the material's structure-property and processing relationship through microstructural characterization. After its adaptation from synchrotrons to a typical research lab, X-ray microscopy has emerged as a rapidly growing 3D characterization tool as it readily provides non-destructive, three-dimensional information for a given sample. Oftentimes, it also enables time dependant in situ and correlative microscopy studies not possible through any other technique. The pursuit to achieve higher resolution is an ongoing one and we are now seeing tremendous acheivements due to the combined advancements in microscopy hardware as well as the advent of deep learning reconstruction algorithms and computational abilities. While the technology behind the microscope is advancing in leaps and bounds, there remains a constant struggle for the microscope end user to keep up and effectively utilize these cutting edge developments in advancing their research. Join us for this microscopy webinar to learn how creating a complete user ecosystem that pushes the boundaries of 3D imaging at high resolution are now possible to be extended over a larger than ever field-of-view through revolutionary deep learning algorithms and novel microscopy hardware. Last but not the least, the talk will cover the main aspect that lies at the center of it all - the user experience. Learn about how these technologies come together in a human-centered microscope interface that puts the user in complete control and assists and guides in navigating through all the advanced capabilities with ease and efficiency. Sample in image courtesy of Prof. Rajarshi Banerjee, University of North Texas, USA