Modern SEM-EDS Systems Explained – What is cutting edge technology today?

What is cutting edge in SEM-EDS technology today? The capabilities of EDS hardware and software have changed so much since I first sat in front of a SEM 30 years ago. Starting with the output from an X-ray detector, we will look at what cutting edge means in practice from several perspectives, to demonstrate how and why we can achieve so much more sensitivity, accuracy and speed. We will also provide insights on how we can overcome specific challenges for nano- and micro-analysis. This is an educational session, we hope will be thought provoking, aimed at linking theory to capability to help us understand where the boundaries of X-ray analysis may now lie. Back by popular demand, this webinar is a condensed version of the seminar presented at M&M 2024 in Cleveland, Ohio, available to all who could not attend this conference. 

Key Learnings:
1. EDS Detector fundamentals and how they influence different types of analysis
2. How the signals coming from a detector are converted to output you see on your EDS software screen, focusing on barriers and how they may be overcome
3. What may be considered cutting-edge today and what is now more routine
4. How to define the performance of a modern EDS system