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    Easily Prepare SEM Samples with Ar Ion Milling logo

    Easily Prepare SEM Samples with Ar Ion Milling

    Free Virtual Seminar
    Now available on-demand

    About the Event

    Are you ready to simplify your SEM sample preparation? Join us for an exclusive webinar where we’ll explore practical techniques to prepare samples for SEM imaging and analysis using Ar ion milling. Whether you're working with traditional, heat-sensitive, or air-sensitive materials, you’ll get actionable insights into revealing the inner structure with broad Ar ion beams through surface polishing or cross-sectional milling.

    Our Speakers

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    DS
    Dr. Thomas Schmidt
    Senior Application and Sales Specialist
    Hitachi High-Tech Europe
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    JS
    Jürgen Simon
    Sales Manager
    Hitachi High-Tech Europe

    Register Now

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