Precision in Particle Size Analysis: Unveiling the Power of Beckman Coulter LS 13 320 XR
About the Event
Discover the power of precision in particle size analysis with the Beckman Coulter LS 13 320 XR. This advanced analyzer features an expanded measurement range from 10 nm to 3,500 µm, utilizing Laser Diffraction and Polarization Intensity Differential Scattering (PIDS) technology for high-resolution detection of particle sizes as small as 10 nm. Learn how the LS 13 320 XR provides reliable, multi-size detection in a single sample with intuitive ADAPT software, designed for both experts and novices. With customizable security, 21 CFR Part 11 compliance, and streamlined operation, this tool ensures consistent, accurate results across industries.
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Polarization Intensity Differential Scattering (PIDS) technology is a Beckman Coulter-patented technique that — combined with laser diffraction — enables direct detection of particles as small as 10 nm.
In this application note the goal will be to identify the fundamentals steps to consider depending on the material type and the delivery module that is the best fit.
Comparison of LS 13 320 XR Laser Diffraction instrument against the Malvern Mastersizer running a customer’s High Purity Carbon in a typical industrial application, the LS 13 320 XR proved its superior capability in peak discrimination, particle sizing accuracy and run to run repeatability.
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