Scanning electron microscopy can be integrated with energy-dispersive X-ray spectroscopy (EDS), Raman imaging, and electron backscatter diffraction (EBSD) in a common vacuum chamber. This complements SEM’s structural acuity with elemental, molecular and crystallographic characterisation techniques, respectively.

Our three presenters will describe the individual methods before showing how their combination provides a more comprehensive understanding of samples. Application examples will focus primarily on battery research, accompanied by investigations of low-dimensional materials, pharmaceutical particles, geoscience specimens and more.  

As RISE (Raman Imaging and Scanning Electron) microscopes offer performance and accessibility, this event will appeal to scientists in a wide range of fields.