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In X-ray applications, the resonant process has been considered an essential approach to exploring charge, spin, and orbital degrees of freedom in material sciences. Notably, the resonant x-ray scattering provides a unique opportunity for a study on materials with element-specific and spatial sensitivity. In particular, resonant elastic and inelastic x-ray scattering (REXS/RIXS) can deliver a piece of profound spectroscopic information as well. The recently developed transition-edge-sensor (TES) technology allows us to employ the REXS/RIXS approach more readily. In this workshop, we will discuss two things: (1) development status on REXS/RIXS capabilities at SSRL; 2) introducing current/future cutting-edge sciences via TES technology.
Organizer:
Jun-Sik Lee, SLAC National Accelerator Laboratory/SSRL
Agenda:
8:00-8:10 AM Welcome/Opening Donghui Lu- SLAC National Accelerator Laboratory/SSRL
8:10-8:30 AM Introduction TES at SSRL Jun-Sik Lee- SLAC National Accelerator Laboratory/SSRL
8:30-9:00 AM Soft X-ray RIXS for energy materials: from transition metals to oxygen Wanli Yang- Lawrence Berkeley National Laboratory
9:00-9:30 AM New Opportunities at the APS: Using Resonant Soft X-rays Scattering to Investigate Emergent Materials Fanny Rodolakis - Advanced Photon Source
9:30-10:00 AM Cationic and anionic redox stratification in lithium-rich battery cathode Yijin Liu- SLAC National Accelerator Laboratory/SSRL
10:00-10:30 AM Break
10:30-11:00 AM Probing low-energy excited states governing photoinduced electron transfer pathways with soft X-ray RIXS Kristjan Kunnus- Stanford University
11:00-11:30 AM RIXS-MCD in the soft x-ray regime using the state-of-the-art TES spectrometer Sang-Jun Lee- SLAC National Accelerator Laboratory/SSRL
11:30-12:00 PM Bigger, faster, better resolution: future TES technology for beamlines Galen O'Neil - National Institute of Standards and Technology